Infinitesima

As semiconductor devices grow in complexity—with shrinking nodes and evolving 3D architectures—accurate, high-speed, nanometre metrology becomes essential. Across the sectors enabled by semiconductors, the pace of innovation depends on the ability to precisely measure and control nanoscale features in real-time production environments. Infinitesima’s Rapid Probe Microscope (RPM) is a solution developed specifically to meet these challenges. Leveraging a novel thermal-optical actuation mechanism combined with interferometric sensing, the RPM achieves precision at speeds >10x faster than conventional AFM systems. The RPM is poised to become a key enabler of advanced node scaling and yield improvement.